The platform running on Apple Silicon does not seem to support the negative nan. It causes the test failure where we explicitly specify the negative nan bit pattern and check the output printed by the CRunnerUtil function. We can make the print function in the utility platform agnostic by using the standard library functions (i.e. `std::isnan` and `std::signbit`) so that we can run the test across platforms that do not support the negative bit pattern. I have added two test cases that would fail in the Apple Silicon platform without print function changes. ``` $ uname -a Darwin Kernel Version 23.3.0: Wed Dec 20 21:30:44 PST 2023; root:xnu-10002.81.5~7/RELEASE_ARM64_T6000 arm64 ``` See: https://discourse.llvm.org/t/test-failure-of-sparse-sign-test-in-apple-silicon/77876/3
6.9 KiB
6.9 KiB